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3D Inspection

EVI SERIES

3D Inspection
개요
The EVI Series is a high-precision, high-speed in-line bump inspection system based on 3D multi-confocal measurement technology.
(Vacuum Function / Individual Substrate Inspection)

특징

1. High-precision and high-speed in-line bump inspection using dedicated jigs for next-generation JEDEC substrates.
2. High-precision, high-speed inspection based on TOKO TAKAOKA’s proprietary 3D Multi-Confocal technology.
3. Advanced features including a Double-Shuttle System and wide Z-axis measurement range.

SPEC

Main Inspection Item

Bump Height, Coplanarity, Diameter

 S10210

 S10220

FOV(유효시야)

15 mm * 15 mm

 15 mm * 15 mm

Z Range

300μm

 300μm

XY Resolution

3.0μm

 2.1μm

Bump Diameter(Min.) & Bump Pitch

25μm / 55μm

 18μm / 36μm

Bump Pitch

3σAVE.+3σ3σ≦2μm

Dimension

(W)2,560mm×(D)2,715mm×(H)1,945mm