CONTACT
Analysis System
특징
Features & Capabilities
• Easily
moved from Tester to Tester
• Custom
docking for all ATE platforms
• High
resolution stage with 0.5 μm repeatability
• Option
to use with an Aplanatic Refractive Solid Immersion Lens (ARSIL)
• CAD
Interface option
• Compatible
with Thermal Management Solutions
• Microscope
Techniques include a combination of:
• Laser Timing Probe (LTP)
• Scanning Optical Microscopy (SOM)
with best sensitivity
• static: TIVA, OBIRCH
• dynamic: LADA, SDL
• Photon Emission Microscopy (PEM)
with various option for
• InGaAs or Si-CCD Camera
• Thermal Microscopy (THM) with InSb camera